D.Phil., Oxford (UK): The observation of Magnetic Structures in a Scanning Electron Microscope
Dr. Joy earned his M.A degree, with First Class Honors, in the Natural Sciences Tripos from Trinity College, Cambridge (UK) in 1966 and his D.Phil in Materials Science from the University of Oxford (UK) in 1966. His dissertation was one of the earliest to make use of the Scanning Electron Microscope and lead to the award of a Junior Research Fellowship at Linacre College. After graduation he was awarded a ICI-Unilever Research Fellowship, and then became the Royal Society Warren Research Fellow at the University of Oxford. He led a group which, with funding from the British Government and the Royal Society, designed and built the first field emission scanning transmission electron microscope outside the USA, and also worked on other projects including the discovery of electron channeling patterns.
In 1974 Dr. Joy accepted a position as a Member of Technical Staff at AT&T Bell Laboratories, Murray Hill, NJ. There he designed and built the first practical imaging electron energy loss spectrometer, and developed the first practical Monte Carlo simulations for electron microscopy to support work in the field of semiconductor device metrology. In 1987 Dr. Joy accepted an appointment in joint positions as a Distinguished Professor at The University of Tennessee and as a Distinguished Scientist at Oak Ridge National Laboratory. Since 2005 he has been responsible for the Electron Microscopy Facility at the Center for Nano Materials Science at Oak Ridge, and since 2009 he has been Theme Leader for the US DOE thrust in “Multiscale Functionality for Nano Materials”. He is a Fellow of both The Royal Microscopical Society (London, UK) and of The Microscopy Society of America. He has received many technical awards including the Battelle Nanoscience Challenge, and the Duncumb Medal of The Microbeam Analysis Society.
Dr. Joy has authored or co-authored nine books, and over 400 technical papers, and has given invited lectures at major meeting in more than 30 countries world-wide. He has taught at the Lehigh Microscopy Schools every year since 1975, and has presented Specialized Short Courses in various aspects of Electron Microscopy in many countries including Australia, France, Germany, UK, Sweden, Japan, Korea, Thailand, Singapore, South Africa, India, Peru, and Argentina.
- Ion Beam Microscopy and Microanalysis
- Techniques to quantify the imaging performance of electron and ion microscopes
- Monte Carlo modeling of electron and ion interactions with solids, liquids, and gases
Selected Awards and Honors
2010 Duncumb Medal for contributions to microanalysis, Microbeam Analysis Society
2009 Elected Fellow The Microscopy Society of America
2001 National Winner Battelle Institute Nanoscience Competition
1999 Semiconductor Research Consortium (SRC) Researcher of the Year Award
- President of The Microscopy Society of America (1999)
- President of The Microbeam Analysis Society (1982)
- Editor ‘The Journal of Microscopy’ (1981-1991)
- Editor in Chief “Scanning” (1992-2011)
- NIH College of Reviewers (since 1980)
Joy D C, (2008), ‘The aberration corrected SEM’, Chapter 3 in Biological Low-Voltage Scanning Electron Microscopy, ed H Schatten and J Pawley, (Springer Science, New York), p107-128.
Joy D C, (2008), ‘Noise and its Effects on the Low-Voltage SEM’, Chapter 4 in Biological Low-Voltage Scanning Electron Microscopy, ed H Schatten and J Pawley, (Springer Science, New York), p129-145.
Klein KL, Melechko A V, McKnight T E, Retterer ST, Rack R D, Fowlkes J D, Joy DC and Simpson ML, (2008), ‘Surface Characterization and functionalization of carbon nanofibers’, J.Appl.Phys., 103 (6), 061301.
Ramachandra R, Griffin B, Joy DC, (2009), ‘A model of secondary electron imaging in the Helium Ion scanning microscope’, Ultramicroscopy 109, 748-757.
Joy, D C (2009), “Scanning Electron Microscopy: Second Best no more”, Nature Materials 8, (10), 776-777.
Hildebrand, M., G. Holton, D. C. Joy, M. J. Doktycz, D. P. Allison (2009) “Diverse and conserved nano-and mesoscale structures of diatom silica revealed by atomic force microscopy” J. Microscopy 2009; 235(2): 172-187.
Cord B, Yang J, Duan H, Joy D C, Klingfus J, Berggren K K, (2009), “Limiting Factors in sub-10nm scanning electron beam lithography”, J Vac Sci Techol. B 27(6), 2616-2621.
Peckys DB, Veith GM, Joy DC, and de Jonge N, (2009), “Nanoscale Imaging of Whole Cells using a Liquid Enclosure and a STEM”, PLoS ONE 4(12) 1-7.
Chung, E., H. Kweon, S. Yiacoumi, I. Lee, D.C. Joy, A.V. Palumbo, and C. Tsouris, (2010) “Adhesion of Spores of Bacillus thuringiensis on a Planar Surface,” Environmental Science & Technology, 44, 290-296 (2010).
Anil K. Suresh, Dale A. Pelletier, Wei Wang, Ji–Wonmoon Baohuagu, Ninnell, P. Mortensen David P. Allison , David C Joy, Tommy J. Phelps, and Mitchel J. Doktycz (2010), “Silver Nanocrystallites: Biofabrication using Shewanellaoneidensis, and an Evaluation of Their Comparative Toxicity on Gram-negative and Gram-positive Bacteria“, Environmental Science and Technology 44, 5210-5215.
Nine Patents variously assigned to Cambridge Scientific, AT&T, and The Semiconductor Research Consortium
232 Science and Engineering Research Facility
Department of Materials Science and Engineering
University of Tennessee
Knoxville, TN 37996-2100
Tel: (865) 974-3642